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international Test Solutions - Probe Polish


Probe Polish™ is a polymeric material containing abrasive particles uniformly and spatially distributed. This material combines the attractive forces of Probe Clean™ with the added benefit of removing embedded contaminants. Probe Polish™ lightly polishes the probe tip and shaft with only slight abrasion to the probe.

Probe Polish™ is ideal for cleaning cantilever type cards with rounded, radius, and flat tip probes. Vertical and area array style cards such as Cobra style with pointed, flat and wedge probes particularly benefit from using this material. Probe Polish™ has the same temperature range as Probe Clean™ and the same flexibility of substrates for on-line and off-line probe card cleaning applications.

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