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MPI - Probecards - Vertical FCB

The FCB Probe Card is the most mature technology of buckling beam probe card. It is a proven solution for a variety of semiconductor production tests including on-wafer high volume manufacturing. FCB guarantees the world’s best overall cost-of-ownership for various DUT applications.

Key features:

- Available in both flat and pointed tip

- Adapted for bond pad patterns such as full array, semi-array, peripheral and staggered chip pattern

- Provide cost-effective solution for mass production

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