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Home > Products > Semiconductor Production > Wafer Prober & Test

Wafer Prober & Test

Each chip on the wafer is electrical tested and characteriest.
Probe card, wafer prober, tester, wafer level burn in tester are used for this process step. Tests are done in temperature from -55°C to +175°C.
After probe the circuit chips on the wafers are seperated with precision diamond saws.
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IS-Test
Workshop - ITWS
2025/09/15 - 16
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Nordson Test & Inspection
Stellar 4000 Bond Test Systems
platform of choice for all manually operated pull and shear production bond testing
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Reid-Ashman
Manipulators
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Reid-Ashman
Electrical Interface
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Reid-Ashman
Docking
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Nordson Test & Inspection
4000 Plus Bond Test System
the industry standard in bondtesting
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Nordson Test & Inspection
4600 Automated Bond Test Systems
Improve reliability and throughput while reducing human influence.
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Bridge
PRVX Motherboards
Interface Solution for Semiconductor Test
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QES Mechatronic Sdn. Bhd.
PPI3300 POST PROBING INSPECTION SYSTEM
FOR 8” & 12”
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H-Square
Automation Tools
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H-Square
WS200 Wafer Sorter Mover
Tabletop, automatic high-value, thin wafer, compound wafer transfer tool
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H-Square
LCT2 Bulk Transfer
Tabletop, automatic high-value, thin wafer, compound wafer transfer tool.
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H-Square
LCT-1AS12 300mm Bulk Transfer
Tabletop, automatic FOUP to FOSB wafer transfer tool.
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H-Square
WS300 Wafer Sorter Mover
Standalone, automatic, single-wafer transfer and wafer mover.
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H-Square
FOUP/FOSB Opener AFO
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H-Square
SMIFPO8 SMIF Opener
Tabletop automatic M200 style SMIF pod opener.
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H-Square
RSP150 SMIF Opener
Tabletop automatic RSP150 style reticle SMIF pod opener.
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H-Square
AFEZ Automatic Flat Aligner
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H-Square
ANFEZ Automatic Notch Aligner
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H-Square
WPR Single Wafer Presenter
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H-Square
Mechanical Wafer Picks
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H-Square
Breezes
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H-Square
MFEZ Manual Flat Aligner
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H-Square
NFEZ Manual Notch Aligner
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H-Square
SSC Stainless Steel Cassettes
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H-Square
AMC Aluminum Metal Cassettes
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H-Square
MCF Process Aluminum Cassettes
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H-Square
FB Fuji Bakelite Cassettes
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H-Square
MC12 300mm Aluminum Cassette
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H-Square
Photomask Cleaning Cassettes
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H-Square
Mask Picks
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H-Square
Vacuum wands
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H-Square
Wafer & Photomask Cassettes
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IOSS
DPM Code Reader next generation- DMR410/420
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MPI - Thermal
ThermalAir TA-1000A ThermalAir Desktop Series
Temperature Forcing System
-25°C to +200°C
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Tesec
MERCURY FREE - 431-TT Discrete Device Test System
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MPI - Thermal
Thermal Air TA-5000A-HT
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MPI - Thermal
ThermalAir TA-3000A ThermalAir Series
Temperature Forcing System
-65°C to +225°C
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MPI - Thermal
ThermalAir TC-100 Air Chiller
High capacity thermal air process chiller
-80°C
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MPI - Thermal
ThermalAir TA-5000A
Precise Temperature Forcing System
-80°C to +225°C
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MPI - Thermal
ThermalAir TA 5000A with Hood
High capacity thermal air stream systems
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MPI - Thermal
ThermalAir TA-5000B with Flex Hose
Precise Temperature Forcing System
-80°C to +225°C
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MPI - Thermal
ThermalAir Accessories
Temperature Chambers & Thermal Test Enclosure
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IS-Test
Accretech / TSK Wafer Prober
Refurbished UF200, UF200A, UF200SA, UF200S, APM90A Prober
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IS-Test
-40°C / - 60°C ONSITE Cold Upgrades
for Accretech / TSK Wafer Prober
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IS-Test
ATT Prober Upgrades
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IS-Test
Prober Cleaning Stage 2.0
for Accretech / TSK Wafer Prober
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IS-Test
Low Noise Upgrade
for Accretech / TSK Wafer Prober
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IS-Test
Dark Probing Sensor
for Accretech / TSK Wafer Prober
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IS-Test
Replacement of SCSI Hard Drives in Wafer Probers with Compact Flash Cards
Upgrades available from now on!
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MarTek Prober
4090μ+ Wafer Prober
Fully Automatic
100mm - 200mm
EG 4090, EG4090µ, EG4090µ+
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MarTek Prober
Refurbished Wafer Probers
Electroglas 2001, 3001, 4085, 4080, 4090X, 4090µ, 4090µ+, 4090FF, and Pathfinder.
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MarTek Prober
Upgrades for Wafer Prober
“Plus” Upgrade for 4080, 4090, and 4090μ
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IOSS
WID120
The new benchmark in wafer ID reading
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MPI - Probecards
Cantilever
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Jenoptik
UFO Probe® CANTILEVER + OPTICAL
2-in-1 probecard for parallel testing of PICs and ICs
(Eurocard format or ATE*)
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ITS
Probe Clean
Probe Card Cleaning Materials, Cleaning Wafer, Non-abrasive loose debris removal
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ITS
Probe Polish
Probe Card Cleaning Materials, Cleaning Wafer, Loose and bonded debris removal
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ITS
Probe Vertical™
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ITS
Probe Form
Probe Card Cleaning Materials, Cleaning Wafer, Reshape probe tips
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