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Thermo Scientific ESD - Celestron

Flexible TLP/VF-TLP (Transmission Line Pulse) test system provides fast, accurate, and reliable characterization of advanced semiconductor structures.

Wafer and package level TLP characterization

Integrated WINDOWS*-based system controller

TLP pulse generator

Integrated source/meter unit

Optional bias supplies (up to 5) under computer control for powered testing and measurements

Can be interfaced with semiautomatic probers

Advanced, intuitive software for control and report generation

Small bench top footprint

Single configuration available for both TLP and VF-TLP testing

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