MPI - Probecards - Vertical FCB
The FCB Probe Card is the most mature technology of buckling beam probe card. It is a proven solution for a variety of semiconductor production tests including on-wafer high volume manufacturing. FCB guarantees the world’s best overall cost-of-ownership for various DUT applications.
Key features:
- Available in both flat and pointed tip
- Adapted for bond pad patterns such as full array, semi-array, peripheral and staggered chip pattern
- Provide cost-effective solution for mass production
Key features:
- Available in both flat and pointed tip
- Adapted for bond pad patterns such as full array, semi-array, peripheral and staggered chip pattern
- Provide cost-effective solution for mass production
Direct Contact
