MPI - Probecards - Vertical EVS

The EVS Probe Card is an enhancement over the conventional bucking beam probe card. Key features are higher C.C.C. and lower force. EVS can easily meet the requirement of advanced wafer probing. Precise alignment and excellence planarity control are the key factors contributing to stable contact resistance. With its capacity and performance, EVS Probe Card is an ideal choice for advanced probe cards.

Key features:

- Available in both flat and pointed tip

- Leave smaller probe mark on the DUT

- Force down to 3.4gf.

- C.C.C. up to 1450mA

- Longer lifetime benefits from longer tip length