Jenoptik - UFO Probe® Vertical + Optical
As the Cantilever Version, the UFO Probe® Vertical enables parallel functional tests of optical as well as electrical components on chips using vertical needle technology from MPI. This allows the user to couple up to 32 optical channels in parallel as standard - or more if required - without the need for active alignment.
- Covers wavelength range from 1260 to 1625 nm used in the telecom and datacom sector
- Ability to provide polarization maintaining for individual or all optical channels
- Testing of bond pads, solder bumps or copper pillars
- Contacts up to tens of thousands of bond pads with dimensions down to 35µm.
- Smallest addressable pitch of electrical contacts from 40 to 80 µm
- Vertical probes with lower and more uniform contact resistance from 0.2 to 1.0 ohms,
depending on the probe type, while minimizing probe marks.
- Ensure economical use in high-volume test scenarios and ATE operability.
- Covers wavelength range from 1260 to 1625 nm used in the telecom and datacom sector
- Ability to provide polarization maintaining for individual or all optical channels
- Testing of bond pads, solder bumps or copper pillars
- Contacts up to tens of thousands of bond pads with dimensions down to 35µm.
- Smallest addressable pitch of electrical contacts from 40 to 80 µm
- Vertical probes with lower and more uniform contact resistance from 0.2 to 1.0 ohms,
depending on the probe type, while minimizing probe marks.
- Ensure economical use in high-volume test scenarios and ATE operability.
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