TTS - Sigma Series Pitch 0.35mm 16 Sites WLCSP Probe Head
TTS Sigma Series WLCSP Probe Heads are designed to provide optimal performance and signal integrity for full functional test of high frequency devices in both the HVM wafer testing environment and during lab qualification.
With long pin life, low inductance, and repeatable and stable contact resistance, Sigma Series Probe Heads can increase first pass yields, reduce maintenance down time, and improve overall cost of test.
TTS uses our internally developed, custom made pins, advanced engineering materials and extensive simulations to ensure we deliver a product that is capable of high parallelism, tri-temp testing, and works out of the box each and every time. With pitch capabilities down to 150um, TTS WLCSP products can meet and exceed all your WLCSP testing needs.
Key features:
- Pin coplanarity less than 100µm
- Pin overdrive greater than 200µm
- Short signal length, high compliance pins
- Available manual actuator with floating alignment for singulated dies
- Easy field maintenance and pin replacement with on-site support available
- Tri-temp testing between -40°C to +125°C
- Optimized for systems up to 6000 total I/O’s
- Pitch from 150µm to 350µm
- Suitable for WLCSP, WLBGA, Cu pillar and bare pad probing
With long pin life, low inductance, and repeatable and stable contact resistance, Sigma Series Probe Heads can increase first pass yields, reduce maintenance down time, and improve overall cost of test.
TTS uses our internally developed, custom made pins, advanced engineering materials and extensive simulations to ensure we deliver a product that is capable of high parallelism, tri-temp testing, and works out of the box each and every time. With pitch capabilities down to 150um, TTS WLCSP products can meet and exceed all your WLCSP testing needs.
Key features:
- Pin coplanarity less than 100µm
- Pin overdrive greater than 200µm
- Short signal length, high compliance pins
- Available manual actuator with floating alignment for singulated dies
- Easy field maintenance and pin replacement with on-site support available
- Tri-temp testing between -40°C to +125°C
- Optimized for systems up to 6000 total I/O’s
- Pitch from 150µm to 350µm
- Suitable for WLCSP, WLBGA, Cu pillar and bare pad probing
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