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Home > Products > Semiconductor Production

Semiconductor Production

All product steps to make an integrated circuit, from forming a crystal to final test of an integrated circuit.
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MPI - Probecards
Vertical EVS
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MPI - Probecards
Vertical OSPREY
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MPI - Probecards
Vertical Grey Owl
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MPI - Probecards
Substrate
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MPI - Thermal
ThermalAir TA-5000A
Precise Temperature Forcing System
-80°C to +225°C
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MPI - Thermal
ThermalAir TA 5000A with Hood
High capacity thermal air stream systems
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MPI - Thermal
ThermalAir TA-5000B with Flex Hose
Precise Temperature Forcing System
-80°C to +225°C
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MPI - Thermal
ThermalAir TC-100 Air Chiller
High capacity thermal air process chiller
-80°C
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MPI - Thermal
ThermalAir Accessories
Temperature Chambers & Thermal Test Enclosure
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IOSS
WID120
The new benchmark in wafer ID reading
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IOSS
90° mirror
90° mirror for horizontal mounting of WID120 and WID110 Wafer ID Reader
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IOSS
External illumination
External illumination for different light angles
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IOSS
DMG100
Data Matrix ECC200 reading and more
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IOSS
DMR220
2D Reading system
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IOSS
DMG110
2D Code Reader for extremely small codes on transparent or reflective surfaces
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IOSS
BCA110
Reticle Barcode Reader
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htt Group
VS5040 Handheld
Handheld Barcode Reader
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3S Korea
300mm FOUP
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3S Korea
300mm FOSB
Model V2
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3S Korea
300mm OPEN CASSETTE
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Mechatronic
Wafer Batch ID Reader System for 200mm Wafer
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QES Mechatronic Sdn. Bhd.
WID100R Wafer Batch ID Reader System for 100mm
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QES Mechatronic Sdn. Bhd.
WID150R Wafer Batch ID Reader System for 150mm Wafer
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QES Mechatronic Sdn. Bhd.
DHS8000
Automatic Barcode Printing and Labelling System
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QES Mechatronic Sdn. Bhd.
DIS8000
Post Dicing Inspection System
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QES Mechatronic Sdn. Bhd.
ISP3100
Post Wire Bond Inspection System
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QES Mechatronic Sdn. Bhd.
LSI1000
Strip Laser Marking Handler System
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QES Mechatronic Sdn. Bhd.
WHS300G
Wafer Batch Transfer System
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QES Mechatronic Sdn. Bhd.
WHS8000
Wafer Sorter System
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Nordson Test & Inspection
WaferSense® Auto Vibration and Leveling Sensor™ AVLS3
Speed simultaneous vibration and leveling measurements.
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Nordson Test & Inspection
WaferSense® Auto Gapping System AGS
Improve Uniformity and Yield with WaferSense AGS for Accurate and Repeatable Setups
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Nordson Test & Inspection
WaferSense® Airborne Particle Sensor™ APS3
Improve equipment set-up and long-term yields by wirelessly monitoring airborne particles in real-time. Thinner. Lighter. Precision Accuracy.
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Nordson Test & Inspection
WaferSense® Auto Leveling System 2 Vertical™ (ALS/ALS2V)
Speeds setting the right inclination by measuring pitch, roll, rise overrun and vertical inclinations. Quickly and accurately set the same level across tools for better process uniformity.
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Nordson Test & Inspection
ReticleSense® Auto Multi Sensor™ AMSR
Speed vibration, leveling and humidity measurements with all-in-one measurement device. Improve yields.
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Nordson Test & Inspection
WaferSense® Auto Vibration System AVS
Speed monitoring 3-axis accelerations and vibration to reduce particles, maintenance time and cycle time.
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Nordson Test & Inspection
WaferSense® Auto Multi Sensor™ AMS
Speed vibration, leveling and humidity measurements with all-in-one measurement device. Improve yields.
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Nordson Test & Inspection
AVLS3 Auto Vibration and Leveling Sensor
WaferSense® Auto Vibration and Leveling Sensor
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Nordson Test & Inspection
ReticleSense® Airborne Particle Sensor APSR
Improve equipment set-up and long term yields by wirelessly monitoring airborne particles in real-time.
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Nordson Test & Inspection
APSRQ ReticleSense® Airborne Particle Sensor
Improve equipment set-up and long term yields by wirelessly monitoring airborne particles in real-time.
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Nordson Test & Inspection
EX-Q
Wafer Mapping Sensors
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Nordson Test & Inspection
EXQS
Wafer Mapping Sensors
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Nordson Test & Inspection
SQ 3000 AOI
High Precision Accuracy with Multi-Reflection Suppression (MRS) Sensor Technology
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MarTek Prober
4090μ+ Wafer Prober
Fully Automatic
100mm - 200mm
EG 4090, EG4090µ, EG4090µ+
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MarTek Prober
Refurbished Wafer Probers
Electroglas 2001, 3001, 4085, 4080, 4090X, 4090µ, 4090µ+, 4090FF, and Pathfinder.
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MarTek Prober
Upgrades for Wafer Prober
“Plus” Upgrade for 4080, 4090, and 4090μ
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IS-Test
Accretech / TSK Wafer Prober
Refurbished UF200, UF200A, UF200SA, UF200S, APM90A Prober
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IS-Test
-40°C / - 60°C ONSITE Cold Upgrades
for Accretech / TSK Wafer Prober
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IS-Test
ATT Prober Upgrades
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IS-Test
Dark Probing Sensor
for Accretech / TSK Wafer Prober
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IS-Test
Replacement of SCSI Hard Drives in Wafer Probers with Compact Flash Cards
Upgrades available from now on!
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IS-Test
Low Noise Upgrade
for Accretech / TSK Wafer Prober
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IS-Test
Prober Cleaning Stage 2.0
for Accretech / TSK Wafer Prober
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Jenoptik
UFO Probe® CANTILEVER + OPTICAL
2-in-1 probecard for parallel testing of PICs and ICs
(Eurocard format or ATE*)
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ITS
Chuck Cleaning Wafer
Engineered Cleaning Solutions for Wafer Handling Tools and Wafer Chuck
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ITS
Probe Clean
Probe Card Cleaning Materials, Cleaning Wafer, Non-abrasive loose debris removal
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ITS
Probe Polish
Probe Card Cleaning Materials, Cleaning Wafer, Loose and bonded debris removal
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ITS
Probe Vertical™
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ITS
Probe Form
Probe Card Cleaning Materials, Cleaning Wafer, Reshape probe tips
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ITS
Probe Lap
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ITS
Probe Scrub
Probe Card Cleaning Materials, Cleaning Wafer, Debris collection on abrasive substrate
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