Contact htt
Back to top
Close Menu
Semiconductor Production
Back
Semiconductor Lab
Back
Electronics
Back
Wafer Reader
Back
Probecards
Back
Home | Probecards | Probecard Cleaning | ITS - Mipox LC6K

ITS - Mipox LC6K


Mipox LC6K
ITS

www.inttest.net
The presence of chlorine ions and chloride contamination on a bond pad surface can act as a catalyst for the copper (Cu) corrosion process and dramatically weaken the copper-aluminum (Cu-Al) intermetallic compounds (IMC). Reduced bond integrity can create long-term reliability issues for packaged devices.

Download Datasheet
Direct Contact

Relevant Products

->

Show product details
ITS
Mipox LC10K
->

Show product details
ITS
MIPOX LC4K
->

Show product details
ITS
Mipox LC8K
->

Show product details
ITS
Probe Vertical™
->

Show product details
ITS
Mipox LC10K
->

Show product details
ITS
Mipox LC8K
->

Show product details
ITS
Probe Form
Probe Card Cleaning Materials, Cleaning Wafer, Reshape probe tips
->

Show product details
ITS
Mipox LC6K
->

Show product details
ITS
Probe Scrub
Probe Card Cleaning Materials, Cleaning Wafer, Debris collection on abrasive substrate
->

Show product details
ITS
MIPOX LC4K
->

Show product details
ITS
Probe Clean
Probe Card Cleaning Materials, Cleaning Wafer, Non-abrasive loose debris removal
->

Show product details
ITS
Test Contactor Cleaning
Cleaning for Contactors and Test Sockets for final Test in any kind of Test Handler
->

Show product details
ITS
Probe Vertical™
->

Show product details
ITS
Probe Polish
Probe Card Cleaning Materials, Cleaning Wafer, Loose and bonded debris removal
->

Show product details
ITS
Chuck Cleaning Wafer
Engineered Cleaning Solutions for Wafer Handling Tools and Wafer Chuck
->

Show product details
ITS
Probe Lap