Entegris - Probe Card Cleaning: Probe Polish® WFL3.0.1™
Probe Polish® WFL3.0™ provides functionalized cleaning to maximum performance, features with regular pattern such as waffle. Cleaning executed on WFL functionalized features produces an efficient cleaning action on the probe tip and sides.
- Comprehensive cleaning solution improves reliability, extends probe life, and ensures cost-effective testing processes.
- Precision cleaning techniques improve probe card performance resulting in more accurate testing
- Customized cleaning surfaces to match specific geometries of probe cards
- Supports regular maintenance extending probe card lifespan, reducing downtime, and increasing cost savings
- Seamless integration with yield management software ensures data compatibility and enhances overall yield management efforts
- Engineered for a wide variety of probe cleaning applications
- Comprehensive cleaning solution improves reliability, extends probe life, and ensures cost-effective testing processes.
- Precision cleaning techniques improve probe card performance resulting in more accurate testing
- Customized cleaning surfaces to match specific geometries of probe cards
- Supports regular maintenance extending probe card lifespan, reducing downtime, and increasing cost savings
- Seamless integration with yield management software ensures data compatibility and enhances overall yield management efforts
- Engineered for a wide variety of probe cleaning applications
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