Entegris - Probe Card Cleaning: Probe Vertical™
Probe Vertical™ is designed to remove embedded and bonded debris from pointed probe tips and collect any loose debris that was generated during probing. The cleaning motion with Probe Vertical is only in the Z direction.
- Comprehensive cleaning solution improves reliability, extends probe life, and ensures cost-effective testing processes.
- Precision cleaning techniques improve probe card performance resulting in more accurate testing
- Customized cleaning surfaces to match specific geometries of probe cards
- Supports regular maintenance extending probe card lifespan, reducing downtime, and increasing cost savings
- Seamless integration with yield management software ensures data compatibility and enhances overall yield management efforts
- Engineered for a wide variety of probe cleaning applications
- Comprehensive cleaning solution improves reliability, extends probe life, and ensures cost-effective testing processes.
- Precision cleaning techniques improve probe card performance resulting in more accurate testing
- Customized cleaning surfaces to match specific geometries of probe cards
- Supports regular maintenance extending probe card lifespan, reducing downtime, and increasing cost savings
- Seamless integration with yield management software ensures data compatibility and enhances overall yield management efforts
- Engineered for a wide variety of probe cleaning applications
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