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international Test Solutions - Probe Form


Probe Form™ was developed for cantilevered probe technologies to provide a cost effective method of uniformly “reforming” a flat probe tip into a smooth, radius shape. Probe Form™ shapes the probe contact surface area of new and worn flat probe tips to attain smooth, radius tips that substantially improve CRES stability and wafer yield. Probe Form™ uses a highly cross-linked, non-corrosive polymer that has an operating temperature range of -50oC to +200oC. A Probe Form™ shaping operation can be easily incorporated into a probe card build process to “form” radius tips or into a probe card maintenance cycle to restore worn or deformed probe tips. Application of online non-destructive cleaning, such as Probe Polish™, will effectively maintain the tip shape.

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