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Home | Semiconductor Lab | ITS - Probe Vertical™

ITS - Probe Vertical™


Probe Vertical™
ITS

www.inttest.net
Probe VerticalTM is designed to remove embedded and bonded debris from verti- cal probe tips and collect any loose debris generated during probing. The abrasive material in the polymer will remove the accumulation of embedded or bonded debris. Probe VerticalTM (ADOE) is designed to maintain the pointed or cone shape of vertical probe needles during the cleaning process.

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