Thermo Scientific ESD - Celestron
Flexible TLP/VF-TLP (Transmission Line Pulse) test system provides fast, accurate, and reliable characterization of advanced semiconductor structures.
Wafer and package level TLP characterization
Integrated WINDOWS*-based system controller
TLP pulse generator
Integrated source/meter unit
Optional bias supplies (up to 5) under computer control for powered testing and measurements
Can be interfaced with semiautomatic probers
Advanced, intuitive software for control and report generation
Small bench top footprint
Single configuration available for both TLP and VF-TLP testing
Wafer and package level TLP characterization
Integrated WINDOWS*-based system controller
TLP pulse generator
Integrated source/meter unit
Optional bias supplies (up to 5) under computer control for powered testing and measurements
Can be interfaced with semiautomatic probers
Advanced, intuitive software for control and report generation
Small bench top footprint
Single configuration available for both TLP and VF-TLP testing
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