Entegris - Probe Card Cleaning: Heat Conducting Wafer (HCW)™
HCW™ is a 300mm SEMI-standard wafer with a stable, heat-conducting polymer applied onto the surface. Advanced memory probe-cards are brought in contact with the surface during prober idle time or after a probe card change in order to accelerate temperature stabilization.
- Comprehensive cleaning solution improves reliability, extends probe life, and ensures cost-effective testing processes.
- Precision cleaning techniques improve probe card performance resulting in more accurate testing
- Customized cleaning surfaces to match specific geometries of probe cards
- Supports regular maintenance extending probe card lifespan, reducing downtime, and increasing cost savings
- Seamless integration with yield management software ensures data compatibility and enhances overall yield management efforts
- Engineered for a wide variety of probe cleaning applications
- Comprehensive cleaning solution improves reliability, extends probe life, and ensures cost-effective testing processes.
- Precision cleaning techniques improve probe card performance resulting in more accurate testing
- Customized cleaning surfaces to match specific geometries of probe cards
- Supports regular maintenance extending probe card lifespan, reducing downtime, and increasing cost savings
- Seamless integration with yield management software ensures data compatibility and enhances overall yield management efforts
- Engineered for a wide variety of probe cleaning applications
Download Datasheet
Direct Contact
