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Home | Semiconductor Production

Semiconductor Production


All product steps to make an integrated circuit, from forming a crystal to final test of an integrated circuit.


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QES Mechatronic Sdn. Bhd.
ISP3100
Post Wire Bond Inspection System
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QES Mechatronic Sdn. Bhd.
LSI1000
Strip Laser Marking Handler System
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QES Mechatronic Sdn. Bhd.
WHS300G
Wafer Batch Transfer System
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QES Mechatronic Sdn. Bhd.
WHS8000
Wafer Sorter System
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Nordson Test & Inspection
WaferSense® Auto Vibration and Leveling Sensor™ AVLS3
Speed simultaneous vibration and leveling measurements.
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Nordson Test & Inspection
WaferSense® Auto Gapping System AGS
Improve Uniformity and Yield with WaferSense AGS for Accurate and Repeatable Setups
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Nordson Test & Inspection
WaferSense® Airborne Particle Sensor™ APS3
Improve equipment set-up and long-term yields by wirelessly monitoring airborne particles in real-time. Thinner. Lighter. Precision Accuracy.
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Nordson Test & Inspection
WaferSense® Auto Leveling System 2 Vertical™ (ALS/ALS2V)
Speeds setting the right inclination by measuring pitch, roll, rise overrun and vertical inclinations. Quickly and accurately set the same level across tools for better process uniformity.
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Nordson Test & Inspection
ReticleSense® Auto Multi Sensor™ AMSR
Speed vibration, leveling and humidity measurements with all-in-one measurement device. Improve yields.
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Nordson Test & Inspection
WaferSense® Auto Vibration System AVS
Speed monitoring 3-axis accelerations and vibration to reduce particles, maintenance time and cycle time.
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Nordson Test & Inspection
WaferSense® Auto Multi Sensor™ AMS
Speed vibration, leveling and humidity measurements with all-in-one measurement device. Improve yields.
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Nordson Test & Inspection
AVLS3 Auto Vibration and Leveling Sensor
WaferSense® Auto Vibration and Leveling Sensor
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Nordson Test & Inspection
ReticleSense® Airborne Particle Sensor APSR
Improve equipment set-up and long term yields by wirelessly monitoring airborne particles in real-time.
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Nordson Test & Inspection
APSRQ ReticleSense® Airborne Particle Sensor
Improve equipment set-up and long term yields by wirelessly monitoring airborne particles in real-time.
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Nordson Test & Inspection
EX-Q
Wafer Mapping Sensors
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Nordson Test & Inspection
EXQS
Wafer Mapping Sensors
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Nordson Test & Inspection
SQ 3000 AOI
High Precision Accuracy with Multi-Reflection Suppression (MRS) Sensor Technology
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MarTek Prober
4090μ+ Wafer Prober
Fully Automatic
100mm - 200mm
EG 4090, EG4090µ, EG4090µ+
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MarTek Prober
Refurbished Wafer Probers
Electroglas 2001, 3001, 4085, 4080, 4090X, 4090µ, 4090µ+, 4090FF, and Pathfinder.
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MarTek Prober
Upgrades for Wafer Prober
“Plus” Upgrade for 4080, 4090, and 4090μ
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IS-Test
Accretech / TSK Wafer Prober
Refurbished UF200, UF200A, UF200SA, UF200S, APM90A Prober
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IS-Test
-40°C / - 60°C ONSITE Cold Upgrades
for Accretech / TSK Wafer Prober
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IS-Test
ATT Prober Upgrades
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IS-Test
Workshop
2025/09/15 - 16
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IS-Test
Dark Probing Sensor
for Accretech / TSK Wafer Prober
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IS-Test
Replacement of SCSI Hard Drives in Wafer Probers with Compact Flash Cards
Upgrades available from now on!
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IS-Test
Low Noise Upgrade
for Accretech / TSK Wafer Prober
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IS-Test
Prober Cleaning Stage 2.0
for Accretech / TSK Wafer Prober
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Jenoptik
UFO Probe® CANTILEVER + OPTICAL
2-in-1 probecard for parallel testing of PICs and ICs
(Eurocard format or ATE*)
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STI
iFocus
AOI wafer inspection for framed and whole wafers
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STI
TR-48 MK 5
2D Taping Machine
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STI
iSORT Express
intelligent, intuitive & incredibly fast Die Sorter
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STI
Hexa Evo
Tray based scanner for Leaded / Leadless Ball Array Packages & large Form Factor packages
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Tesec
Gravity Handler
High Speed Tri-Temperature Handler
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Tesec
Gravity Handler
Power Device High Speed Tri-temp Handler
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Tesec
MEMS handler
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Tesec
TAB Handler
Tab Handler AH9710
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MSP
2300G3
Particle Deposition Systems
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MSP
Nano Silica
Silica Nanoparticles Size Standards
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MSP
2800 Turbo Vaporizer
Vaporizer for CVD, PECVD and ALD
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