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Semiconductor Production
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Substrate
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MPI - Thermal
ThermalAir TA-5000A Precise Temperature Forcing System
-80°C to +225°C
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MPI - Thermal
ThermalAir TA 5000A with Hood
High capacity thermal air stream systems
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MPI - Thermal
ThermalAir TA-5000B with Flex Hose Precise Temperature Forcing System
-80°C to +225°C
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MPI - Thermal
ThermalAir TC-100 Air Chiller High capacity thermal air process chiller
-80°C
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MPI - Thermal
ThermalAir Accessories
Temperature Chambers & Thermal Test Enclosure
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IOSS
WID120
The new benchmark in wafer ID reading
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IOSS
90° mirror
90° mirror for horizontal mounting of WID120 and WID110 Wafer ID Reader
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IOSS
External illumination
External illumination for different light angles
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IOSS
DMG100
Data Matrix ECC200 reading and more
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IOSS
DMR220
2D Reading system
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IOSS
DMG110
2D Code Reader for extremely small codes on transparent or reflective surfaces
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IOSS
BCA110
Reticle Barcode Reader
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htt Group
VS5040 Handheld
Handheld Barcode Reader
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3S Korea
300mm FOUP
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3S Korea
300mm FOSB
Model V2
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3S Korea
300mm OPEN CASSETTE
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Mechatronic
Wafer Batch ID Reader System for 200mm Wafer
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QES Mechatronic Sdn. Bhd.
WID100R Wafer Batch ID Reader System for 100mm
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QES Mechatronic Sdn. Bhd.
WID150R Wafer Batch ID Reader System for 150mm Wafer
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QES Mechatronic Sdn. Bhd.
DHS8000
Automatic Barcode Printing and Labelling System
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QES Mechatronic Sdn. Bhd.
DIS8000
Post Dicing Inspection System
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QES Mechatronic Sdn. Bhd.
ISP3100
Post Wire Bond Inspection System
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QES Mechatronic Sdn. Bhd.
LSI1000
Strip Laser Marking Handler System
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QES Mechatronic Sdn. Bhd.
WHS300G
Wafer Batch Transfer System
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QES Mechatronic Sdn. Bhd.
WHS8000
Wafer Sorter System
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Cyberoptics Semiconductor
WaferSense® Auto Vibration and Leveling Sensor™ AVLS3
Speed simultaneous vibration and leveling measurements.
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Cyberoptics Semiconductor
WaferSense® Auto Gapping System AGS
Improve Uniformity and Yield with WaferSense AGS for Accurate and Repeatable Setups
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Cyberoptics Semiconductor
WaferSense® Airborne Particle Sensor™ APS3
Improve equipment set-up and long-term yields by wirelessly monitoring airborne particles in real-time. Thinner. Lighter. Precision Accuracy.
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Cyberoptics Semiconductor
WaferSense® Auto Leveling System 2 Vertical™ (ALS/ALS2V)
Speeds setting the right inclination by measuring pitch, roll, rise overrun and vertical inclinations. Quickly and accurately set the same level across tools for better process uniformity.
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Cyberoptics Semiconductor
ReticleSense® Auto Multi Sensor™ AMSR
Speed vibration, leveling and humidity measurements with all-in-one measurement device. Improve yields.
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Cyberoptics Semiconductor
WaferSense® Auto Vibration System AVS
Speed monitoring 3-axis accelerations and vibration to reduce particles, maintenance time and cycle time.
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Cyberoptics Semiconductor
WaferSense® Auto Multi Sensor™ AMS
Speed vibration, leveling and humidity measurements with all-in-one measurement device. Improve yields.
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Cyberoptics Semiconductor
AVLS3 Auto Vibration and Leveling Sensor
WaferSense® Auto Vibration and Leveling Sensor
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Cyberoptics Semiconductor
ReticleSense® Airborne Particle Sensor APSR
Improve equipment set-up and long term yields by wirelessly monitoring airborne particles in real-time.
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Cyberoptics Semiconductor
APSRQ ReticleSense® Airborne Particle Sensor
Improve equipment set-up and long term yields by wirelessly monitoring airborne particles in real-time.
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Cyberoptics Semiconductor
EX-Q
Wafer Mapping Sensors
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Cyberoptics Semiconductor
EXQS
Wafer Mapping Sensors
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Cyberoptics Semiconductor
SQ 3000 AOI
High Precision Accuracy with Multi-Reflection Suppression (MRS) Sensor Technology
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MarTek Prober
4090
μ
+ Wafer Prober
Fully Automatic
100mm - 200mm
EG 4090, EG4090µ, EG4090µ+
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MarTek Prober
Refurbished Wafer Probers
Electroglas 2001, 3001, 4085, 4080, 4090X, 4090µ, 4090µ+, 4090FF, and Pathfinder.
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MarTek Prober
Upgrades for Wafer Prober
“Plus” Upgrade for 4080, 4090, and 4090μ
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IS-Test
Accretech / TSK Wafer Prober
Refurbished UF200, UF200A, UF200SA, UF200S, APM90A Prober
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IS-Test
-40°C / - 60°C ONSITE Cold Upgrades
for Accretech / TSK Wafer Prober
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