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Semiconductor Production
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All product steps to make an integrated circuit, from forming a crystal to final test of an integrated circuit.
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MPI - Thermal
ThermalAir TA 5000A with Hood
High capacity thermal air stream systems
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MPI - Thermal
ThermalAir TA-5000B with Flex Hose Precise Temperature Forcing System
-80°C to +225°C
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MPI - Thermal
ThermalAir TC-100 Air Chiller High capacity thermal air process chiller
-80°C
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MPI - Thermal
ThermalAir Accessories
Temperature Chambers & Thermal Test Enclosure
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AEHR Test Systems
FOX-NP Full Wafer & Singulated Die / Module Test System
Compact High Power Test and Reliability Verifications Solution for Logic / Memory / Photonic Devices
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AEHR Test Systems
FOX-CP Full Wafer Test System
Compact Test and Reliability Verification Solution for Logic/Memory/Photonic Devices
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AEHR Test Systems
FOX-XP Multi Wafer & Singulated Die / Module Test System
High Throughput Burn-in and Test Solution for Logic / Memory / Photonic Devices
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AEHR Test Systems
FOX XP WaferPak Aligner
Wafer Loader / Unloader for FOX WaferPak Contactors
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AEHR Test Systems
FOX-1P Full Wafer Test System
High Power Test and Reliability Verification Solution for Logic / Memory / Photonic Devices
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AEHR Test Systems
FOX - Die Pak Carrier
Singulated Die / Module Test & Burn-in
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AEHR Test Systems
DiePak Loader
Device Loader / Unloader for FOX DiePak Carriers
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AEHR Test Systems
ABTS
A high capacity system for test and burn-in of logic devices
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AEHR Test Systems
Burn-in-Boards
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AEHR Test Systems
Automated ABTS BIB Loader
Automated Burn-In Board (BIB) loading and unloading solution
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IOSS
WID120
The new benchmark in wafer ID reading
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IOSS
90° mirror
90° mirror for horizontal mounting of WID120 and WID110 Wafer ID Reader
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IOSS
External illumination
External illumination for different light angles
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IOSS
DMG100
Data Matrix ECC200 reading and more
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IOSS
DMR220
2D Reading system
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IOSS
DMG110
2D Code Reader for extremely small codes on transparent or reflective surfaces
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IOSS
BCA110
Reticle Barcode Reader
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htt Group
VS5040 Handheld
Handheld Barcode Reader
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3S Korea
300mm FOUP
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3S Korea
300mm FOSB
Model V2
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3S Korea
300mm OPEN CASSETTE
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Mechatronic
Wafer Batch ID Reader System for 200mm Wafer
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QES Mechatronic Sdn. Bhd.
WID100R Wafer Batch ID Reader System for 100mm
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QES Mechatronic Sdn. Bhd.
WID150R Wafer Batch ID Reader System for 150mm Wafer
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QES Mechatronic Sdn. Bhd.
DHS8000
Automatic Barcode Printing and Labelling System
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QES Mechatronic Sdn. Bhd.
DIS8000
Post Dicing Inspection System
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QES Mechatronic Sdn. Bhd.
ISP3100
Post Wire Bond Inspection System
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QES Mechatronic Sdn. Bhd.
LSI1000
Strip Laser Marking Handler System
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QES Mechatronic Sdn. Bhd.
WHS300G
Wafer Batch Transfer System
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QES Mechatronic Sdn. Bhd.
WHS8000
Wafer Sorter System
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Cyberoptics Semiconductor
WaferSense® Auto Vibration and Leveling Sensor™ AVLS3
Speed simultaneous vibration and leveling measurements.
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Cyberoptics Semiconductor
WaferSense® Auto Gapping System AGS
Improve Uniformity and Yield with WaferSense AGS for Accurate and Repeatable Setups
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Cyberoptics Semiconductor
WaferSense® Airborne Particle Sensor™ APS3
Improve equipment set-up and long-term yields by wirelessly monitoring airborne particles in real-time. Thinner. Lighter. Precision Accuracy.
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Cyberoptics Semiconductor
WaferSense® Auto Leveling System 2 Vertical™ (ALS/ALS2V)
Speeds setting the right inclination by measuring pitch, roll, rise overrun and vertical inclinations. Quickly and accurately set the same level across tools for better process uniformity.
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Cyberoptics Semiconductor
ReticleSense® Auto Multi Sensor™ AMSR
Speed vibration, leveling and humidity measurements with all-in-one measurement device. Improve yields.
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Cyberoptics Semiconductor
WaferSense® Auto Vibration System AVS
Speed monitoring 3-axis accelerations and vibration to reduce particles, maintenance time and cycle time.
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Cyberoptics Semiconductor
WaferSense® Auto Multi Sensor™ AMS
Speed vibration, leveling and humidity measurements with all-in-one measurement device. Improve yields.
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Cyberoptics Semiconductor
AVLS3 Auto Vibration and Leveling Sensor
WaferSense® Auto Vibration and Leveling Sensor
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Cyberoptics Semiconductor
ReticleSense® Airborne Particle Sensor APSR
Improve equipment set-up and long term yields by wirelessly monitoring airborne particles in real-time.
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Cyberoptics Semiconductor
APSRQ ReticleSense® Airborne Particle Sensor
Improve equipment set-up and long term yields by wirelessly monitoring airborne particles in real-time.
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Cyberoptics Semiconductor
EX-Q
Wafer Mapping Sensors
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Cyberoptics Semiconductor
EXQS
Wafer Mapping Sensors
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Cyberoptics Semiconductor
SQ 3000 AOI
High Precision Accuracy with Multi-Reflection Suppression (MRS) Sensor Technology
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MarTek Prober
4090
μ
+ Wafer Prober
Fully Automatic
100mm - 200mm
EG 4090, EG4090µ, EG4090µ+
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