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Have a look on htt’s current exhibitions, new product lines, product updates, cooperations and more to stay up to date with the htt Group, the Semiconductor Industry and tomorrow’s technologies.
ASTI releases new product - AT-468 Rotary Scan-Pack Handler
May 26, 2014

ASTI releases new product - AT-468 Rotary Scan-Pack Handler

ASTI's AT-468 Rotary Scan-Pack Handler for Lead & Leadless Packages.



Major features:


  • Device test stations available

  • Laser marking option available


More product information here

CSZ releases new Benchtop Vibration Table
May 16, 2014

CSZ releases new Benchtop Vibration Table

Read this press release for more inforamtion about CSZ (Cincinnati Sub Zero)'s new product, the Benchtop Vibration Table.

6. ITWS - MEMS Probing & Probing @The Limits
May 08, 2014

6. ITWS - MEMS Probing & Probing @The Limits



Announcement - The next IS-Test Workshop will start next week, May 12th & 13th, 2014.



For more information please click here


Mechatronic mBWR200 Press Release @ imveurope
May 05, 2014

Mechatronic mBWR200 Press Release @ imveurope

To see the full Press Release regarding Mechatronicc mBWR200 Batch Wafer Reader please click here.




Visit htt at SMT Show in Nürnberg, 6th-8th of May, 2014, booth # 9-549
April 29, 2014

Visit htt at SMT Show in Nürnberg, 6th-8th of May, 2014, booth # 9-549

We are looking forward to seing you at our booth. Our Sales Engineers are happy to give you a detailled overview about our products like


  • ADT - Dicing Saws, Blades and Peripheral Products

  • Johnstech - High Performance Test Sockets

  • ASTI - Tape & Reel Systems, DIE-Sorter

  • Cincinnati Sub Zero - temperature chambers

  • Despatch - LCC & LCD Clean Process Ovens


  • Fancort - universal Trim and Form Tool

  • FTS - Precision Temperature Cycling Systems



For more information please have a look here

HTT Group's SPECIAL CUSTOMIZED PROBECARDS
April 24, 2014

HTT Group's SPECIAL CUSTOMIZED PROBECARDS


Htt Probecard Division has built any probe card for a wafer scale solution with a needle count up to 460 in two rows and 4 levels.


The special feature is the linear expansion over 13 cm.


Basic premise for a perfect measurement is a good cooperation between the needle spider and the Board with the corresponding stiffener.



For more detailled information about our broad range of customized probecards please click here


April 10, 2014

Watch EMV Show's video

Have a look on this official EMV 2014 show video showing our business partner Bill O'Brian (Thermo Fisher) giving some statements about the show!



For more product Infos about Thermo Fisher Scientific ESD products please click here










Pressure Test Probe Card
April 08, 2014

Pressure Test Probe Card


The Pressure Test Probe Card allows to connect a MEMS DUT with Probe Needles at the same time the MEMS membrane oft he DUT is set under pressure up till 3 bar. The deflection of the membrane can be watched throught the clear pressure foot surface.


htt Probecard Division - ISO 9001:2008 certified for the 3rd year in a row
April 07, 2014

htt Probecard Division - ISO 9001:2008 certified for the 3rd year in a row


April 05, 2014

Mechatronic mBWR200 - Press Release @ imveurope

Click here to see the full press release regarding our Mechatronic mBWR200 Batch Wafer Reader.












Watch our new Video for Probe Test Rig
February 25, 2014

Watch our new Video for Probe Test Rig



Check out product details here

htt proudly announces its new Service Manager Arne Holland.
February 25, 2014

htt proudly announces its new Service Manager Arne Holland.

For all matters regarding Service and CE issues please do not hesitate to contact Arne Holland, new htt Group Service - and CE Manager.

Rigaku sells first 450mm TXRF Tóol
February 20, 2014

Rigaku sells first 450mm TXRF Tóol


Our partner Rigaku Corporation recently announced the sale of its first 450mm TXRF Total-Reflection X-Ray Fluorescence Spectrometer tool to a global Semiconductor Equipment Manufacturer.


Rigaku TXRF systems are widely used for contamination measurements on the front- and/or backside surface of semiconductor substrates like silicon or silicon-carbide.


Please feel free to read Rigaku’s press release dated Feb 13, 2014 on our website.


htt group will join Semicon China Show, March 18 - 20, 2014
February 18, 2014

htt group will join Semicon China Show, March 18 - 20, 2014

Visit us onsite for life demonstrations of IOSS WID110 and Mechatronic mBWR200 Batch Wafer Reader at booth # 4535 in Hall N4.



For more information please click here

Johnstech releases new product 'IQtouch Micro' for Wafer Level Final Test
February 18, 2014

Johnstech releases new product 'IQtouch Micro' for Wafer Level Final Test



htt group will join EMV2014 Show from 11th to 13th of March, 2014
February 17, 2014

htt group will join EMV2014 Show from 11th to 13th of March, 2014

Visit htt together with Thermo Fisher Scientific at booth # CCD-024.



For more information please clicke here

htt group in Korean Newspaper article
February 16, 2014

htt group in Korean Newspaper article

For more information please click here.

Have a look at our new Wedge Probe Card Presentation
January 17, 2014

Have a look at our new Wedge Probe Card Presentation

Wedge Probe Cards are available at htt Probecard Division


Watch our new mBWR200 Batch Wafer Reader Video
December 18, 2013

Watch our new mBWR200 Batch Wafer Reader Video





For more product information please click here

WID110 Wafer ID Reader Flyer availabel in Japanese now!
December 17, 2013

WID110 Wafer ID Reader Flyer availabel in Japanese now!